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Evidence Provided By Sims and Exafs, of Ge Microclusters in Gaas Epitaxial Layers Obtained On Ge By Csvt

Bibliographic reference Dodelet, JP. ; Tourillon, G. ; Depuydt, Y. ; Cossement, D. ; Guay, D. ; et. al. Evidence Provided By Sims and Exafs, of Ge Microclusters in Gaas Epitaxial Layers Obtained On Ge By Csvt. In: Journal of the Electrochemical Society, Vol. 138, no. 10, p. 3125-3131 (1991)
Permanent URL http://hdl.handle.net/2078.1/50893