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Ac Capacitance and Conductance Measurements of 2-terminal Metal-oxide-semiconductor-oxide-semiconductor Capacitors On Silicon-on-insulator Substrates

Bibliographic reference Flandre, Denis ; Campabadal, F. ; Esteve, J. ; Loratamayo, E. ; Vandewiele, F.. Ac Capacitance and Conductance Measurements of 2-terminal Metal-oxide-semiconductor-oxide-semiconductor Capacitors On Silicon-on-insulator Substrates. In: Journal of Applied Physics, Vol. 70, no. 9, p. 5111-5113 (1991)
Permanent URL http://hdl.handle.net/2078.1/50834
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