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Evidence of Different Conduction Mechanisms in Accumulation-mode P-channel Soi Mosfets At Room and Liquid-helium Temperatures

Bibliographic reference Rotondaro, ALP. ; Flandre, Denis ; Magnusson, UK. ; Claeys, C. ; Terao, A. ; et. al. Evidence of Different Conduction Mechanisms in Accumulation-mode P-channel Soi Mosfets At Room and Liquid-helium Temperatures. In: IEEE Transactions on Electron Devices, Vol. 40, no. 4, p. 727-732 (1993)
Permanent URL http://hdl.handle.net/2078.1/49842