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Quantitative Xps .2. Comparison Between Different Quantitative Approaches for 2 Different Spectrometers - Determination of the Contamination-reduced Thickness, Application of the Determined Transmission Functions and Accuracy Achieved

Bibliographic reference Weng, LT. ; Vereecke, G. ; Genet, MJ. ; Rouxhet, Paul ; Stonemasui, JH. ; et. al. Quantitative Xps .2. Comparison Between Different Quantitative Approaches for 2 Different Spectrometers - Determination of the Contamination-reduced Thickness, Application of the Determined Transmission Functions and Accuracy Achieved. In: Surface and Interface Analysis, Vol. 20, no. 3, p. 193-205 (1993)
Permanent URL http://hdl.handle.net/2078.1/49807
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