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Extraction of Physical Device Dimensions of Soi Mosfets From Gate Capacitance Measurements

Bibliographic reference Flandre, Denis ; Gentinne, B.. Extraction of Physical Device Dimensions of Soi Mosfets From Gate Capacitance Measurements. In: Electronics Letters, Vol. 29, no. 7, p. 586-588 (April 1, 1993)
Permanent URL http://hdl.handle.net/2078.1/49584