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Evidence of 2-dimensional Carrier Confinement in Thin N-channel Soi Gate-all-around (gaa) Devices

Bibliographic reference Colinge, JP. ; Baie, X. ; Bayot, Vincent. Evidence of 2-dimensional Carrier Confinement in Thin N-channel Soi Gate-all-around (gaa) Devices. In: IEEE Electron Device Letters, Vol. 15, no. 6, p. 193-195 (1994)
Permanent URL http://hdl.handle.net/2078.1/48890