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The Esd Protection Mechanisms and the Related Failure Modes and Mechanisms Observed in Soi Snapback Nmosfets

Bibliographic reference Verhaege, K. ; Groeseneken, G. ; Colinge, JP. ; Maes, HE.. The Esd Protection Mechanisms and the Related Failure Modes and Mechanisms Observed in Soi Snapback Nmosfets. In: Microelectronics Reliability, Vol. 35, no. 3, p. 555-566 (1995)
Permanent URL http://hdl.handle.net/2078.1/48207