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Combined Time-of-flight Secondary-ion Mass-spectrometry and X-ray Photoelectron-spectroscopy Study of the Surface Segregation of Poly(methyl Methacrylate) (pmma) in Bisphenol-a Polycarbonate Pmma Blends

Bibliographic reference Lhoest, JB. ; Bertrand, Patrick ; Weng, LT. ; Dewez, JL.. Combined Time-of-flight Secondary-ion Mass-spectrometry and X-ray Photoelectron-spectroscopy Study of the Surface Segregation of Poly(methyl Methacrylate) (pmma) in Bisphenol-a Polycarbonate Pmma Blends. In: Macromolecules, Vol. 28, no. 13, p. 4631-4637 (1995)
Permanent URL http://hdl.handle.net/2078.1/47997