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Time-of-flight Secondary-ion Mass-spectrometry (tof-sims) Study of Sf6 and Sf6-cf4 Plasma-treated Low-density Polyethylene Films

Bibliographic reference Leonard, Didier ; Bertrand, Patrick ; Khairallahabdelnour, Y. ; Arefikhonsari, F. ; Amouroux, J.. Time-of-flight Secondary-ion Mass-spectrometry (tof-sims) Study of Sf6 and Sf6-cf4 Plasma-treated Low-density Polyethylene Films. In: Surface and Interface Analysis, Vol. 23, no. 7-8, p. 467-476 (1995)
Permanent URL http://hdl.handle.net/2078.1/47946
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