User menu

Sizing Removal and Functionalization of the Carbon-fiber Surface Studied By Combined Tof Sims and Xps

Bibliographic reference Weng, LT. ; Legras, Roger ; Poleunis, Claude ; Bertrand, Patrick ; Carlier, Véronique ; et. al. Sizing Removal and Functionalization of the Carbon-fiber Surface Studied By Combined Tof Sims and Xps. In: Journal of Adhesion Science and Technology : the international journal of theoretical and basic aspects of adhesion science and its applications in all areas of technology, Vol. 9, no. 7, p. 859-871 (1995)
Permanent URL
  1. Wakelyn N. T., Resolution of wide-angle x-ray scattering from a thermoplastic composite, 10.1002/pola.1986.080240906
  2. Xie, Y., Wang, T. and Sherwood, P. M. A. 1992.Appl. SpectroscVol. 46, 645 and refs cited therein
  3. Drzal L.T., The role of the fiber-matrix interphase on composite properties, 10.1016/0042-207x(90)94034-n
  4. Santiago F., Mansour A. N., Lee R. N., XPS study of sizing removal from carbon fibers, 10.1002/sia.740100105
  5. Desimoni E., Casella G. I., Cataldi T. R. I., Salvi A. M., Rotunno T., Di Croce E., Remarks on the surface characterization of carbon fibres, 10.1002/sia.740180809
  6. Briggs, D. 1992.Practical Surface and Interface Analysis, Edited by: Briggs, D. and Seah, M. P. Vol. 2, 368Chichester: John Wiley.
  7. Hearn M. J., Briggs D., TOF-SIMS satudies of carbon-fibre surfaces and carbon-fibre composite fracture surfaces, 10.1002/sia.740170704
  8. Carlier, V., Sclavons, M., Franquinet, P., Legras, R., Poleunis, C., Weng, L. T. and Bertrand, P. August 1994.Proceedings of the First International Conference on Composites Engineering, Edited by: Hui, D. August, 28–31. 831New Orleans: University of New Orleans. New Orleans
  9. Schueler B., Sander P., Reed D.A., A time-of-flight secondary ion microscope, 10.1016/0042-207x(90)94047-t
  10. Xie Yaoming, Sherwood Peter M. A., AS4 PAN‐based Carbon Fiber by Core Level and Valence Band XPS, 10.1116/1.1247657
  11. Weng L. T., Vereecke G., Genet M. J., Rouxhet P. G., Stone-Masui J. H., Bertrand P., Stone W. E. E., Quantitative XPS. Part II: Comparison between different quantitative approaches for two different spectrometers?determination of the contamination-reduced thickness, application of the determined transmission functions and accuracy achieved, 10.1002/sia.740200303
  12. Hammer G.E., Drzal L.T., Graphite fiber surface analysis by X-ray photoelectron spectroscopy and polar/dispersive free energy analysis, 10.1016/0378-5963(80)90083-5
  13. Briggs, D., Brown, A. and Vickerman, J. C. 1989.Handbook of Static SIMS, 42Chichester: John Wiley.
  14. Briggs, D. and Seah, M. P., eds. 1990.Practical Surface and Interface Analysis, 2nd, Vol. 1, 603Chichester: John Wiley.
  15. Tan K. L., Tan B. T. G., Kang E. T., Neoh K. G., The chemical nature of the nitrogens in polypyrrole and polyaniline: A comparative study by x‐ray photoelectron spectroscopy, 10.1063/1.460524
  16. Beamson G., High Resolution XPS of Organic Polymers: The Scienta ESCA 300 Database (1992)