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The effect of series resistance on threshold voltage measurement techniques for fully depleted SOI MOSFETs

Bibliographic reference Wainwright, SP ; Hall, S. ; Flandre, Denis. The effect of series resistance on threshold voltage measurement techniques for fully depleted SOI MOSFETs. In: Solid-State Electronics, Vol. 39, no. 1, p. 89-94 (1996)
Permanent URL http://hdl.handle.net/2078.1/47464