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Surface functionalization of PEEK films studied by time-of-flight secondary ion mass spectrometry and x-ray photoelectron spectroscopy

Bibliographic reference Henneuse-Boxus, C ; Poleunis, Claude ; De Ro, A ; Adriaensen, Yasmine ; Bertrand, Patrick ; et. al. Surface functionalization of PEEK films studied by time-of-flight secondary ion mass spectrometry and x-ray photoelectron spectroscopy. In: Surface and Interface Analysis, Vol. 27, no. 3, p. 142-152 (1999)
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