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Conducting tip atomic force microscopy analysis of aluminum oxide barrier defects decorated by electrodeposition

Bibliographic reference Carrey, J ; Bouzehouane, K. ; George, JM. ; Ceneray, C ; Fert, A. ; et. al. Conducting tip atomic force microscopy analysis of aluminum oxide barrier defects decorated by electrodeposition. In: Applied Physics Letters, Vol. 79, no. 19, p. 3158-3160 (2001)
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