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ToF-SIMS ability to quantify surface chemical groups: Correlation with XPS analysis and spectrochemical titration

Bibliographic reference Medard, N ; Aouinti, M ; Poncin-Epaillard, F ; Bertrand, Patrick. ToF-SIMS ability to quantify surface chemical groups: Correlation with XPS analysis and spectrochemical titration. In: Surface and Interface Analysis, Vol. 31, no. 11, p. 1042-1047 (2001)
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