Delannay, Laurent
[UCL]
Loge, R.E.
Chastel, Y.
Signorelli, J.W.
Van Houtte, Paul
[UCL]
EBSD orientation mapping over large sample areas (see Figure for a close-up of three grains extracted from an orientation map) gives the basis data for a statistical evaluation on orientation gradients developed within grains of a cold-rolled aluminum plate. This data set serves as a counterpart for finite-element simulations for checking whether the orientation gradients observed can be attributed to the interaction of adjacent grains. Although the tendency of the simulations fits the experiment, the amplitude of the orientation spread is always underestimated, whatever the initial orientation of grains.
Bibliographic reference |
Delannay, Laurent ; Loge, R.E. ; Chastel, Y. ; Signorelli, J.W. ; Van Houtte, Paul. Measurement of in-grain orientation gradients by EBSD and comparison with finite element results. In: Advanced Engineering Materials, Vol. 5, no. 8, p. 597-600 (2003) |
Permanent URL |
http://hdl.handle.net/2078.1/40832 |