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Interface characterization of nanoscale laminate structures on dense dielectric substrates by x-ray reflectivity

Bibliographic reference Travaly, Y. ; Schuhmacher, J ; Hoyas, AM ; Van Hove, Marie-Anne ; Maex, K ; et. al. Interface characterization of nanoscale laminate structures on dense dielectric substrates by x-ray reflectivity. In: Journal of Applied Physics, Vol. 97, no. 8 (2005)
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