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On the relation between growth instabilities and internal stress evolution during galvanostatic Ti thin film anodization

Bibliographic reference Vanhumbeeck, J. -F. ; Proost, Joris. On the relation between growth instabilities and internal stress evolution during galvanostatic Ti thin film anodization. In: Journal of the Electrochemical Society, Vol. 155, no. 10, p. C506-C514 (2008)
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