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Transmission electron microscopy study of phase compatibility in low hysteresis shape memory alloys

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Delville, Remi Kasinathan, Sakthivel Zhang, Zhiyong Van Humbeeck, Jan [UCL] James, Richard D. Schryvers, Dominique

Recent findings have linked low hysteresis in shape memory alloys with phase compatibility between austenite and martensite. To investigate the evolution of microstructure as phase compatibility increases and hysteresis is reduced, transmission electron microscopy was used to study the alloy system Ti50Ni50-xPdx, where the composition is systemically tuned to approach perfect compatibility. Changes in morphology, twinning density and twinning modes are reported, along with special microstructures occurring when compatibility is achieved. In addition, the interface between austenite and a single variant of martensite was studied by high-resolution and conventional electron microscopy. The low energy configuration of the interface detailed in this article suggests that it plays an important role in the lowering of hysteresis compared to classical habit plane interfaces.

Document type Article de périodique (Journal article) – Article de recherche
Publication date 2010
Language Anglais
Journal information "Philosophical Magazine (London, 2003)" - Vol. 90, no. 1-4, p. 177-195 (2010)
Peer reviewed yes
Publisher Taylor & Francis Ltd (Abingdon)
issn 1478-6435
e-issn 1478-6443
Publication status Publié
Affiliation UCL
Keywords electron microscopy ; martensitic transformation ; interfaces ; hysteresis
Links
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Bibliographic reference Delville, Remi ; Kasinathan, Sakthivel ; Zhang, Zhiyong ; Van Humbeeck, Jan ; James, Richard D. ; et. al. Transmission electron microscopy study of phase compatibility in low hysteresis shape memory alloys. In: Philosophical Magazine (London, 2003), Vol. 90, no. 1-4, p. 177-195 (2010)
Permanent URL http://hdl.handle.net/2078.1/34800