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Imperfection-sensitive ductility of aluminium thin films

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Coulombier, Michaël [UCL] Boe, Alexandre [UCL] Brugger, C. [UCL] Raskin, Jean-Pierre [UCL] Pardoen, Thomas [UCL]

Ductility, defined as the strain at the onset of necking, has been characterized in thin Al films using an on-chip, internal stress actuated, microtensile testing setup. In the smallest specimens, the ductility is equal to 0.08 and 0.27 for 200 and 375 nm thick films, respectively, while the average strain-hardening exponents are, respectively, equal to 0.11 and 0.23. In addition to the thickness effect, ductility decreases with increasing specimen size due to imperfection sensitivity, involving a size-dependent statistical behaviour. (C) 2010 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.

Document type Article de périodique (Journal article) – Article de recherche
Access type Accès restreint
Publication date 2010
Language Anglais
Journal information "Scripta Materialia" - Vol. 62, no. 10, p. 742-745 (2010)
Peer reviewed yes
Publisher Pergamon-elsevier Science Ltd (Oxford)
issn 1359-6462
e-issn 1872-8456
Publication status Publié
Affiliations UCL - SST/IMMC - Institute of Mechanics, Materials and Civil Engineering
UCL - SST/ICTM - Institute for Information and Communication. Technologies, Electronics and Applied Mathematics
Keywords Ductility ; Thin films ; Aluminium ; Strain hardening
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Bibliographic reference Coulombier, Michaël ; Boe, Alexandre ; Brugger, C. ; Raskin, Jean-Pierre ; Pardoen, Thomas. Imperfection-sensitive ductility of aluminium thin films. In: Scripta Materialia, Vol. 62, no. 10, p. 742-745 (2010)
Permanent URL http://hdl.handle.net/2078.1/33978