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Effect of Current Density on the Internal Stress Evolution during Galvanostatic Ti Thin Film Anodizing

Bibliographic reference Van Overmeere, Quentin ; Vanhumbeeck, J. -F. ; Proost, Joris. Effect of Current Density on the Internal Stress Evolution during Galvanostatic Ti Thin Film Anodizing. In: Journal of the Electrochemical Society, Vol. 157, no. 5, p. C166-C173 (2010)
Permanent URL http://hdl.handle.net/2078.1/33966
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