User menu

Thermal Noise in MOSFETs: A Two- or a Three-Parameter Noise Model?

Bibliographic reference Emam, Mostafa ; Sakalas, Paulius ; Vanhoenacker-Janvier, Danielle ; Raskin, Jean-Pierre ; Lim, Tao Chuan ; et. al. Thermal Noise in MOSFETs: A Two- or a Three-Parameter Noise Model?. In: IEEE Transactions on Electron Devices, Vol. 57, no. 5, p. 1188-1191 (2010)
Permanent URL http://hdl.handle.net/2078.1/33824