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Variance and Skewness of Current Fluctuations Experimentally Evidenced in Single-Photon Avalanche Diodes
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Document type | Communication à un colloque (Conference Paper) – Présentation orale avec comité de sélection |
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Access type | Accès libre |
Publication date | 2023 |
Language | Anglais |
Conference | "2023 International Conference on Noise and Fluctuations (ICNF)", Grenoble, France (du 17/10/2023 au 20/10/2023) |
Peer reviewed | yes |
Host document | "2023 International Conference on Noise and Fluctuations (ICNF)" (ISBN : 979-8-3503-3011-3) |
Publication status | Publié |
Affiliations |
UCL
- SST/ICTM/ELEN - Pôle en ingénierie électrique UCL - SST/ICTM/INMA - Pôle en ingénierie mathématique |
Links |
Bibliographic reference | Van Brandt, Léopold ; Vercauteren, Roselien ; Haya Enriquez, Diego ; André, Nicolas ; Kilchytska, Valeriya ; et. al. Variance and Skewness of Current Fluctuations Experimentally Evidenced in Single-Photon Avalanche Diodes.2023 International Conference on Noise and Fluctuations (ICNF) (Grenoble, France, du 17/10/2023 au 20/10/2023). In: 2023 International Conference on Noise and Fluctuations (ICNF), 2023 |
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Permanent URL | http://hdl.handle.net/2078.1/287699 |