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Raman Strain-Shift Measurements and Prediction from First-Principles in Highly-Strained Silicon

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Bibliographic reference Roisin, Nicolas ; Colla, Marie-Stéphane ; Raskin, Jean-Pierre ; Flandre, Denis. Raman Strain-Shift Measurements and Prediction from First-Principles in Highly-Strained Silicon. In: Journal of Materials Science: Materials in Electronics, Vol. 34, p. 373 (2023)
Permanent URL http://hdl.handle.net/2078.1/272249