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Enhanced Stability and Mobility of Solution-Processed Oxide Thin-Film Transistors with Bilayer Terbium-incorporated Indium Oxide Channel

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Bibliographic reference He, Penghui ; Ding, Chunchun ; Li, Guoli ; Hu, Wei ; Ma, Chao ; et. al. Enhanced Stability and Mobility of Solution-Processed Oxide Thin-Film Transistors with Bilayer Terbium-incorporated Indium Oxide Channel. In: Applied Physics Letters, Vol. 121, no.19, p. 21 (2022)
Permanent URL http://hdl.handle.net/2078.1/266612