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Improving MOSFET Piezoresistive Strain Gauges Limit of Detection Using Lock-In Principle

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Bibliographic reference Delhaye, Thibault ; Roisin, Nicolas ; André, Nicolas ; Francis, Laurent ; Flandre, Denis. Improving MOSFET Piezoresistive Strain Gauges Limit of Detection Using Lock-In Principle.IEEE Sensors 2021 (virtual conference, du 31/10/2021 au 04/11/2021). In: Proceedings of the IEEE Sensors 2021, 2021
Permanent URL http://hdl.handle.net/2078.1/259484