A Stochastic Geometry Approach to EMF Exposure Modeling

Gontier, Quentin Petrillo, Lucas Rottenberg, Francois Horlin, Francois Wiart, Joe Oestges, Claude [UCL] De Doncker, Philippe

Downlink exposure to electromagnetic fields due to cellular base stations in urban environments is studied using the stochastic geometry framework. A two-dimensional Poisson Point Process is assumed for the base station distribution. Mathematical expressions of statistics of exposure are derived from a simple propagation model taking into account the height of the base stations. The error on exposure made by taking a limited number of base stations, instead of the whole set, is quantified. The relative impact of the model parameters on the statistics of exposure is highlighted. The method is then applied and the model parameters are calibrated using experimental data obtained by drive-tests in two Brussels municipalities, in Belgium, for the 2100 MHz and 2600 MHz frequency bands. It is shown that the proposed model fits experimental values, paving the way to a new methodology to assess general public exposure to electromagnetic fields, for any frequency band. An insight is given on how to apply the methodology to a real case without access to experimental data.