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Influence of the Organic Layer Thickness in (Metal-Assisted) Secondary Ion Mass Spectrometry Using Ga(+) and C(60)(+) Projectiles.

Bibliographic reference Wehbe, Nimer ; Mouhib, Taoufiq ; Prabhakaran Nair Syamala Amma, Aneesh ; Bertrand, Patrick ; Delcorte, Arnaud. Influence of the Organic Layer Thickness in (Metal-Assisted) Secondary Ion Mass Spectrometry Using Ga(+) and C(60)(+) Projectiles.. In: Journal of the American society for mass spectrometry, Vol. 20, no. 12, p. 2294-2303 (2009)
Permanent URL http://hdl.handle.net/2078.1/24980
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