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Effect of hydriding induced defects on the small-scale plasticity mechanisms in nanocrystalline palladium thin films
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Document type | Article de périodique (Journal article) – Article de recherche |
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Access type | Accès libre |
Publication date | 2018 |
Language | Anglais |
Journal information | "Journal of Applied Physics" - Vol. 124, no.22, p. 225105 (2018) |
Peer reviewed | yes |
Publisher | AIP Publishing |
issn | 0021-8979 |
e-issn | 1089-7550 |
Publication status | Publié |
Affiliations |
UCL
- SST/IMMC/IMAP - Materials and process engineering University of Antwerp - EMAT Colorado School of Mines - Department of Mechanical Engineering Zurich University of Applied Sciences - Institute for Materials and Process Engineering (IMPE) |
Keywords | Nanocrystalline Pd films ; Mechanical testing ; ACOM-TEM ; Stacking faults ; Electron microscopy |
Links |
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Bibliographic reference | Lumbeeck, Gunnar ; Idrissi, Hosni ; Amin-Ahmadi, Behnam ; Favache, Audrey ; Delmelle, Renaud ; et. al. Effect of hydriding induced defects on the small-scale plasticity mechanisms in nanocrystalline palladium thin films. In: Journal of Applied Physics, Vol. 124, no.22, p. 225105 (2018) |
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Permanent URL | http://hdl.handle.net/2078.1/212430 |