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Advanced TEM analysis of deformation and growth twins in coarse and nano-grained materials
Primary tabs
Document type | Communication à un colloque (Conference Paper) – Conférence invitée / Keynote |
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Publication date | 2011 |
Language | Anglais |
Conference | "The XIVth International Conference on Electron Microscopy", Wisla, Poland (du 26/06/2011 au 30/06/2011) |
Peer reviewed | yes |
Publication status | Publié |
Affiliations |
UCL
- SST/IMMC/IMAP - Materials and process engineering UCL - SST/ICTM/ELEN - Pôle en ingénierie électrique |
Links |
Bibliographic reference | Pardoen, Thomas ; Jacques, P. J. ; Schryvers, D. ; Idrissi, Hosni ; Wang B. ; et. al. Advanced TEM analysis of deformation and growth twins in coarse and nano-grained materials.The XIVth International Conference on Electron Microscopy (Wisla, Poland, du 26/06/2011 au 30/06/2011). |
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Permanent URL | http://hdl.handle.net/2078.1/200251 |