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Advanced TEM analysis of deformation and growth twins in coarse and nano-grained materials

Bibliographic reference Pardoen, Thomas ; Jacques, P. J. ; Schryvers, D. ; Idrissi, Hosni ; Wang B. ; et. al. Advanced TEM analysis of deformation and growth twins in coarse and nano-grained materials.The XIVth International Conference on Electron Microscopy (Wisla, Poland, du 26/06/2011 au 30/06/2011).
Permanent URL http://hdl.handle.net/2078.1/200251