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Structural characterization of double stacking faults induced by cantilever bending in nitrogen-doped 4H-SiC

Bibliographic reference Regula, G. ; Lancin, M. ; Idrissi, Hosni ; Pichaud, B. ; Douin, J.. Structural characterization of double stacking faults induced by cantilever bending in nitrogen-doped 4H-SiC. In: Philosophical Magazine Letters, Vol. 85, p. 259-267 (2005)
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