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Fruit Microstructure Evaluation Using Synchrotron X-Ray Computed Tomography

Bibliographic reference Verboven, Pieter ; Ho, Quang Tri ; Herremans, Els ; Mebatsion, Hibru Kelemu ; Nicolai, Bart ; et. al. Fruit Microstructure Evaluation Using Synchrotron X-Ray Computed Tomography.International Conference on Engineering and Food (ICEF) (Vina del Mar, Chile, 20-24 April 2008). In: Tenth International Congress on Engineering and Food Program Book and Abstracts, Springer2011
Permanent URL http://hdl.handle.net/2078/194654