Novel high-resolution micro-CT based surface roughness measurement protocol for complex porous structures

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Kerckhofs, Greet [UCL]

Pyka, Grzegorz Velasco Martin, Enrique Moesen, Maarten Schrooten, Jan Wevers, Martine

Document type	Communication à un colloque (Conference Paper)
Publication date	2010
Language	Anglais
Conference	"Cellular Materials (CellMat) 2010", Dresden, Germany (25-27 October 2010)
Affiliations	KUL KUL
Links	http://hdl.handle.net/2078/194627[Handle]

Bibliographic reference	Kerckhofs, Greet ; Pyka, Grzegorz ; Velasco Martin, Enrique ; Moesen, Maarten ; Schrooten, Jan ; et. al. Novel high-resolution micro-CT based surface roughness measurement protocol for complex porous structures.Cellular Materials (CellMat) 2010 (Dresden, Germany, 25-27 October 2010).
Permanent URL	http://hdl.handle.net/2078/194627