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Novel high-resolution micro-CT based surface roughness measurement protocol for complex porous structures
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Bibliographic reference | Kerckhofs, Greet ; Pyka, Grzegorz ; Velasco Martin, Enrique ; Moesen, Maarten ; Schrooten, Jan ; et. al. Novel high-resolution micro-CT based surface roughness measurement protocol for complex porous structures.Cellular Materials (CellMat) 2010 (Dresden, Germany, 25-27 October 2010). |
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Permanent URL | http://hdl.handle.net/2078/194627 |