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Measurement and modelling of specific behaviors in 28nm FD SOI UTBB MOSFETs of importance for analog / RF amplifiers

Bibliographic reference Flandre, Denis ; Kilchytska, Valeriya ; Gimeno Gasca, Cecilia ; Bol, David ; Kazemi Esfeh, Babak ; et. al. Measurement and modelling of specific behaviors in 28nm FD SOI UTBB MOSFETs of importance for analog / RF amplifiers.MOS-AK Workshop (Leuven (Belgium), 11/09/2017).
Permanent URL http://hdl.handle.net/2078.1/192479