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Gradient Importance Sampling: an Efficient Statistical Extraction methodology of High-Sigma SRAM Dynamic Characteristics

Bibliographic reference Haine, Thomas ; Segers, Johan ; Flandre, Denis ; Bol, David. Gradient Importance Sampling: an Efficient Statistical Extraction methodology of High-Sigma SRAM Dynamic Characteristics.DATE 2018, Design, Automation and Test in Europe (Dresden (Germany), du 19/03/2018 au 23/03/2018).
Permanent URL http://hdl.handle.net/2078.1/191730