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Back-gate bias effect on FDSOI MOSFET RF Figures of Merits and Parasitic Elements

Bibliographic reference Kazemi Esfeh, Babak ; Kilchytska, Valeriya ; Parvais, Bertrand ; Planes, N. ; Haond, M. ; et. al. Back-gate bias effect on FDSOI MOSFET RF Figures of Merits and Parasitic Elements.2017 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS 2017) (Athens (Greece), du 03/04/2017 au 05/04/2017). In: Proceedings of EUROSOI-ULIS 2017, (03/07/2017)In: Proceedings of the 2017 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS 2017), IEEE2017
Permanent URL http://hdl.handle.net/2078.1/190976