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Analog and RF analysis of gate-all-around silicon nanowire MOSFET

Bibliographic reference Liu, Linjie ; Han, Qinghua ; Makovejev, Sergej ; Trellenkamp, S. ; Raskin, Jean-Pierre ; et. al. Analog and RF analysis of gate-all-around silicon nanowire MOSFET.2017 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon – ULIS (Athens, Greece, du 03/04/2017 au 05/04/2017). In: Proceedings of 2017 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon – ULIS, IEEE2017, p. Poster # 8
Permanent URL http://hdl.handle.net/2078.1/189981