User menu

Electromechanical testing of ZnO thin films under high uniaxial strain

Bibliographic reference Tuyaerts, Romain ; Raskin, Jean-Pierre ; Proost, Joris. Electromechanical testing of ZnO thin films under high uniaxial strain.The 30th International Conference on Microelectronic Test Structures – ICMTS 2017 (Grenoble, France, du 28/03/2017 au 30/03/2017). In: Proceedings of the 30th International Conference on Microelectronic Test Structures – ICMTS 2017, IEEE2017, p. paper # 2.3
Permanent URL http://hdl.handle.net/2078.1/189971