User menu

Small and large-signal wideband characterization of RF SOI technology

Bibliographic reference Raskin, Jean-Pierre. Small and large-signal wideband characterization of RF SOI technology.The 30th International Conference on Microelectronic Test Structures – ICMTS 2017 (Grenoble, France, du 28/03/2017 au 30/03/2017). In: Proceedings of The 30th International Conference on Microelectronic Test Structures – ICMTS 2017, 2017, p. invited paper#1
Permanent URL http://hdl.handle.net/2078.1/187276