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Small and large-signal wideband characterization of RF SOI technology
Primary tabs
| Document type | Communication à un colloque (Conference Paper) – Conférence invitée / Keynote |
|---|---|
| Publication date | 2017 |
| Language | Anglais |
| Conference | "The 30th International Conference on Microelectronic Test Structures – ICMTS 2017", Grenoble, France (du 28/03/2017 au 30/03/2017) |
| Peer reviewed | yes |
| Host document | "Proceedings of The 30th International Conference on Microelectronic Test Structures – ICMTS 2017"- p. invited paper#1 |
| Publication status | Publié |
| Affiliation | UCL - SST/ICTM/ELEN - Pôle en ingénierie électrique |
| Links |
| Bibliographic reference | Raskin, Jean-Pierre. Small and large-signal wideband characterization of RF SOI technology.The 30th International Conference on Microelectronic Test Structures – ICMTS 2017 (Grenoble, France, du 28/03/2017 au 30/03/2017). In: Proceedings of The 30th International Conference on Microelectronic Test Structures – ICMTS 2017, 2017, p. invited paper#1 |
|---|---|
| Permanent URL | http://hdl.handle.net/2078.1/187276 |