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Electromechanical testing of ZnO thin films under high uniaxial strain

Bibliographic reference Tuyaerts, Romain ; Raskin, Jean-Pierre ; Proost, Joris. Electromechanical testing of ZnO thin films under high uniaxial strain.The 30th International Conference on Microelectronic Test Structures - ICMTS 20017 (Grenoble, France, du 20/03/2017 au 30/03/2017). In: Proceedings of The 30th International Conference on Microelectronic Test Structures - ICMTS 2017, 2017, p. Paper #2.3
Permanent URL http://hdl.handle.net/2078.1/187275