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Raman measurements of uniaxial strain in silicon nanostructures

Bibliographic reference Urena, Ferran ; Olsen, Sarah H. ; Raskin, Jean-Pierre. Raman measurements of uniaxial strain in silicon nanostructures. In: Journal of Applied Physics, Vol. 114, no.14 (October 2013)
Permanent URL http://hdl.handle.net/2078.1/187268
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