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On the temperature dependence of frequency dispersion in C-V measurements of III-V MOS devices and its application in spatial profiling of border traps

Bibliographic reference Vais, Abhitosh ; Lin, Han-Chung ; Dou, Chunmeng ; Martens, Koen ; Ivanov, Tzvetan ; et. al. On the temperature dependence of frequency dispersion in C-V measurements of III-V MOS devices and its application in spatial profiling of border traps. In: Applied Physics Letters, Vol. 107, no.5, p. 053504-1 - 053504-5 (May 2015)
Permanent URL http://hdl.handle.net/2078.1/187248
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