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Fracture mechanisms in freestanding polycrystalline silicon films with nanoscale thickness

Bibliographic reference Vayrette, Renaud ; Galceran, M. ; Coulombier, Michaël ; Godet, S. ; Raskin, Jean-Pierre ; et. al. Fracture mechanisms in freestanding polycrystalline silicon films with nanoscale thickness. In: Engineering Fracture Mechanics, Vol. 68, no.Part A, p. 190-203 (December 2016)
Permanent URL http://hdl.handle.net/2078.1/187227