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Compact On-Wafer Test Structures for Device RF Characterization

Bibliographic reference Kazemi Esfeh, Babak ; Ben Ali, Khaled ; Raskin, Jean-Pierre. Compact On-Wafer Test Structures for Device RF Characterization. In: IEEE Transactions on Electron Devices, Vol. 64, no.8, p. 3101-3107 (August 2017)
Permanent URL http://hdl.handle.net/2078.1/187225