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RF SOI CMOS technology on 1st and 2nd generation trap-rich high resistivity SOI wafers

Bibliographic reference Kazemi Esfeh, Babak ; Makovejev, Sergej ; Basso, Didier ; Desbonnets, Eric ; Kilchytska, Valeriya ; et. al. RF SOI CMOS technology on 1st and 2nd generation trap-rich high resistivity SOI wafers. In: Solid-State Electronics, Special Issue EuroSOI-ULIS 2016, Vol. 128, no.February 2017, p. 121-128 (February 2017)
Permanent URL http://hdl.handle.net/2078.1/187199