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Raman and XPS characterization of vanadium oxide thin films with temperature

Bibliographic reference Ureña Begara, Fernando ; Crunteanu, Aurelian ; Raskin, Jean-Pierre. Raman and XPS characterization of vanadium oxide thin films with temperature. In: Applied Surface Science, Vol. 403, no.1 May 2017, p. 717-727 (May 2017)
Permanent URL http://hdl.handle.net/2078.1/187198