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Characterizing root system characteristics with Electrical resistivity Tomography: a virtual rhizotron simulation

Bibliographic reference Rao, Sathyanarayan ; Ehosioke, Solomon ; Lesparre, Nolwenn ; Nguyen, Frédéric ; Javaux, Mathieu. Characterizing root system characteristics with Electrical resistivity Tomography: a virtual rhizotron simulation.EGU General Assembly (Vienna, Austria, du 23/04/2017 au 28/04/2017). In: Geophysical Research Abstracts, Vol. 19, p. EGU2017-4405
Permanent URL http://hdl.handle.net/2078.1/183094