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Improved fidelity of brain microstructure mapping from single-shell diffusion MRI
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Taquet, Maxime
[UCL]
Scherrer, Benoit
[Harvard Medical School]
Boumal, Nicolas
[Princeton]
Peters, Jurriaan
[Boston]
Macq, Benoît
[UCL]
Warfield, Simon K.
[Harvard]
Warfield, Simon K.
[Harvard]
| Document type | Article de périodique (Journal article) – Article de recherche |
|---|---|
| Access type | Accès restreint |
| Publication date | 2015 |
| Language | Anglais |
| Journal information | "Medical Image Analysis" - Vol. 26, no.1, p. 268-286 (2015) |
| Peer reviewed | yes |
| Publisher | Elsevier BV ((Netherlands) Amsterdam) |
| issn | 1361-8415 |
| e-issn | 1361-8423 |
| Publication status | Publié |
| Affiliation | UCL - SST/ICTM/ELEN - Pôle en ingénierie électrique |
| Links |
| Bibliographic reference | Taquet, Maxime ; Scherrer, Benoit ; Boumal, Nicolas ; Peters, Jurriaan ; Macq, Benoît ; et. al. Improved fidelity of brain microstructure mapping from single-shell diffusion MRI. In: Medical Image Analysis, Vol. 26, no.1, p. 268-286 (2015) |
|---|---|
| Permanent URL | http://hdl.handle.net/2078.1/181181 |