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Reliable characteristics and stabilization of on-membrane SOI MOSFET-based components heated up to 335 °C

Bibliographic reference Amor, Sedki ; André, Nicolas ; Gérard, Pierre ; Ali, S.Z. ; Udrea, F. ; et. al. Reliable characteristics and stabilization of on-membrane SOI MOSFET-based components heated up to 335 °C. In: Semiconductor Science and Technology, Vol. 32, no.1, p. 9 (19/12/2016)
Permanent URL http://hdl.handle.net/2078.1/181119