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Ultra-low-power 130nm SOI CMOS smart sensor for in-situ mechanical stress in SiP and SoC applications

Bibliographic reference Al Kadi Jazairli, Mohamad ; André, Nicolas ; Tooten, Ester ; Olbrechts, Benoit ; Raskin, Jean-Pierre ; et. al. Ultra-low-power 130nm SOI CMOS smart sensor for in-situ mechanical stress in SiP and SoC applications.14th International Conference Reliability and Stress-Related Phenomena in Nanoelectronics - Experiment and Simulation (IRSP 2016) (Bad Schandau (Germany), du 30/05/2016 au 01/06/2016).
Permanent URL http://hdl.handle.net/2078.1/176010