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A novel on chip test method to characterize the creep behavior of metallic layers under heavy ion irradiation

Bibliographic reference Lapouge, Pierre ; Onimus, Fabien ; Vayrette, Renaud ; Raskin, Jean-Pierre ; Pardoen, Thomas ; et. al. A novel on chip test method to characterize the creep behavior of metallic layers under heavy ion irradiation. In: Journal of Nuclear Materials, Vol. 476, no. --, p. 20-29 (2016)
Permanent URL http://hdl.handle.net/2078.1/174333